Ключевые слова: chalcogenide, coated conductors, films, IBAD process, substrate Hastelloy, PLD process, buffer layers, X-ray diffraction, microstructure, resistive transition, critical temperature, upper critical fields, irreversibility fields, temperature dependence, critical caracteristics, Jc/B curves, pinning force
Ключевые слова: experimental results, chalcogenide, FeSeTe, coated conductors, PLD process, substrate Hastelloy, IBAD process, buffer layers, magnetron sputtering, targets, X-ray diffraction, thickness dependence, lattice parameter, resistive transition, critical temperature, microstructure, critical current density, pnictides, comparison, critical caracteristics, upper critical fields, Jc/B curves, temperature dependence, pinning force
Ключевые слова: HTS, YGdBCO, doping effect, pinning centers artificial, coated conductors, PLD process, IBAD process, substrate Hastelloy, X-ray diffraction, lattice parameter, microstructure, magnetization, temperature dependence, critical temperature, critical caracteristics, Jc/B curves, pinning force, pinning mechanism, critical current density, angular dependence, experimental results, in-field performance
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